However, there exists the second kind of outliers. Quite often strange looking data observations are not artificial data occurrences. They may be just representatives of the underlying generation mechanism being inseparable internal part of the process (endogenous outliers). In such a case they are not wrong and should be treated with cautiousness, as they may include important information about the dynamic nature of the process. As such they cannot be neglected nor simply removed. The Outlier should be detected, labelled and suitably treated. These activities cannot be performed without proper analytical tools and modeling approaches. There are dozens of methods proposed by scientists, starting from Gaussian-based statistical scoring up to data mining artificial intelligence tools. The research presented in this book presents novel approach incorporating non-Gaussian statistical tools and fractional calculus approach revealing new data analytics applied to this important and challenging task. The proposed book includes a collection of contributions addressing different yet cohesive subjects, like dynamic modelling, classical control, advanced control, fractional calculus, statistical analytics focused on an ultimate goal: robust and outlier-proof analysis. All studied problems show that outliers play an important role and classical methods, in which outlier are not taken into account, do not give good results. Applications from different engineering areas are considered such as semiconductor process control and monitoring, MIMO peltier temperature control and health monitoring, networked control systems, and etc.