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Variational and Topological Methods in the Study of Nonlinear Phenomena
Barnes and Noble
Variational and Topological Methods in the Study of Nonlinear Phenomena
Current price: $109.99
Barnes and Noble
Variational and Topological Methods in the Study of Nonlinear Phenomena
Current price: $109.99
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This volume covers recent advances in the field of nonlinear functional analysis and its applications to nonlinear partial and ordinary differential equations, with particular emphasis on variational and topological methods. A broad range of topics is covered, including:
• concentration phenomena in pdes
• variational methods with applications to pdes and physics
• periodic solutions of odes
• computational aspects in topological methods
• mathematical models in biology Though well-differentiated, the topics covered are unified through a common perspective and approach. Unique to the work are several chapters on computational aspects and applications to biology, not usually found with such basic studies on pdes and odes. The volume is an excellent reference text for researchers and graduate students in the above mentioned fields. Contributors: M. Clapp, M. Del Pino, M.J. Esteban, P. Felmer, A. Ioffe, W. Marzantowicz, M. Mrozek, M. Musso, R. Ortega, P. Pilarczyk, E. Séré, E. Schwartzman, P. Sintzoff, R. Turner , M. Willem
• concentration phenomena in pdes
• variational methods with applications to pdes and physics
• periodic solutions of odes
• computational aspects in topological methods
• mathematical models in biology Though well-differentiated, the topics covered are unified through a common perspective and approach. Unique to the work are several chapters on computational aspects and applications to biology, not usually found with such basic studies on pdes and odes. The volume is an excellent reference text for researchers and graduate students in the above mentioned fields. Contributors: M. Clapp, M. Del Pino, M.J. Esteban, P. Felmer, A. Ioffe, W. Marzantowicz, M. Mrozek, M. Musso, R. Ortega, P. Pilarczyk, E. Séré, E. Schwartzman, P. Sintzoff, R. Turner , M. Willem