The following text field will produce suggestions that follow it as you type.

Barnes and Noble

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

Current price: $165.00
RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors
RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

Barnes and Noble

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

Current price: $165.00

Size: OS

Loading Inventory...
CartBuy Online
*Product information may vary - to confirm product availability, pricing, shipping and return information please contact Barnes and Noble
This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based.

More About Barnes and Noble at The Summit

With an excellent depth of book selection, competitive discounting of bestsellers, and comfortable settings, Barnes & Noble is an excellent place to browse for your next book.

Powered by Adeptmind